The sample mask test compares the coverage mask for a fragment with the sample mask defined by afxPipelineMultisamplingConfig::sampleMasks.
Each bit of the coverage mask is associated with a sample index as described in the rasterization chapter. If the bit in afxPipelineMultisamplingConfig::sampleMasks which is associated with that same sample index is set to 0, the coverage mask bit is set to 0.
Responses